Pindel
Pindel can detect breakpoints of large deletions, medium sized insertions, inversions, tandem duplications and other structural variants at single-based resolution from next-gen sequence data.
It uses a pattern growth approach to identify the breakpoints of these variants from paired-end short reads.
Contact
If you need help or have any queries, please contact us using the details below.
Please contact Kai Ye ( kye@genome.wustl.edu )
Sanger Institute Contributors
Dr Zemin Ning
Senior Scientific Manager